About Graphcore
At Graphcore, we’re building the future of AI compute. We’re a team of semiconductor, software and AI experts, with deep experience in creating the complete AI compute stack - from silicon and software to infrastructure at datacenter scale. As part of the SoftBank Group, backed by significant long-term investment, we are delivering key technology into the fast-growing SoftBank AI ecosystem.To meet the vast and exciting AI opportunity, Graphcore is expanding its teams around the world. We are bringing together the brightest minds to solve the toughest problems, in a place where everyone has the opportunity to make an impact on the company, our products and the future of artificial intelligence.
At Graphcore, we’re building the future of AI compute. We’re a team of semiconductor, software and AI experts, with deep experience in creating the complete AI compute stack - from silicon and software to infrastructure at datacenter scale. As part of the SoftBank Group, backed by significant long-term investment, we are delivering key technology into the fast-growing SoftBank AI ecosystem.To meet the vast and exciting AI opportunity, Graphcore is expanding its teams around the world. We are bringing together the brightest minds to solve the toughest problems, in a place where everyone has the opportunity to make an impact on the company, our products and the future of artificial intelligence. Job Summary We are seeking a Senior Semiconductor Reliability Engineer to lead reliability strategy and execution across advanced silicon nodes and advanced packaging technologies, spanning both pre-silicon and post-silicon phases. This role is responsible for ensuring robust product reliability from technology selection and design enablement through silicon bring-up, qualification, and high-volume manufacturing. The successful candidate will work at the intersection of device physics, circuit design, packaging, and manufacturing, providing technical leadership on reliability risk assessment, modeling, qualification, and failure analysis for complex, high-performance devices.